SUGIHARTONO, Iwan; 						BUDI, Esmar; 						BUDI, Agus Setyo.
 X-ray Photoelectron Spectroscopy (XPS) Analysis of Undoped ZnO and ZnO:Er Thin Films.
<strong>Jurnal ILMU DASAR</strong>, [S.l.], v. 16, n. 1, p. 13-15, june 2015.
ISSN 2442-5613.
Available at: &lt;<a href="https://jurnal.unej.ac.id/index.php/JID/article/view/1052" target="_new">https://jurnal.unej.ac.id/index.php/JID/article/view/1052</a>&gt;. Date accessed: 25 nov. 2024.
doi: <a href="https://doi.org/10.19184/jid.v16i1.1052">https://doi.org/10.19184/jid.v16i1.1052</a>.