Noor, Fatimah, 		Masturi, Masturi, 		Abdullah, Mikrajuddin, AND 		Khairurrijal, Khairurrijal.
" Effect of Thickness and Temperature of SiO2 Layer on Leakage Currents in MOS Capacitor Materials with High Dielectric Constant by Involving the Charge Trap" <em>Jurnal ILMU DASAR</em> [Online], Volume 15 Number 1 (7 August 2014)