Noor, F., 		Masturi, M., 		Abdullah, M., & 		Khairurrijal, K.
2014 Aug  7.  Effect of Thickness and Temperature of SiO2 Layer on Leakage Currents in MOS Capacitor Materials with High Dielectric Constant by Involving the Charge Trap. Jurnal ILMU DASAR. [Online] 15:1