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 The Effects of Oxygen Content, Deposition Rate and Annealing Towards Thin Film of Indium Tin Oxide.
<strong>Jurnal ILMU DASAR</strong>, [S.l.], v. 12, n. 1, p. 57-61, jan. 2012.
ISSN 2442-5613.
Available at: &lt;<a href="https://jurnal.unej.ac.id/index.php/JID/article/view/355" target="_new">https://jurnal.unej.ac.id/index.php/JID/article/view/355</a>&gt;. Date accessed: 13 nov. 2024.