PHOA, Victor; 						RAKHMAD, Hariyono.
 Testing and Comparison of SN754410N and L293D Driver IC Variants.
<strong>Jurnal Arus Elektro Indonesia</strong>, [S.l.], v. 10, n. 1, p. 6-11, feb. 2024.
ISSN 2443-2318.
Available at: &lt;<a href="https://jurnal.unej.ac.id/index.php/E-JAEI/article/view/39120" target="_new">https://jurnal.unej.ac.id/index.php/E-JAEI/article/view/39120</a>&gt;. Date accessed: 05 nov. 2024.
doi: <a href="https://doi.org/10.19184/jaei.v10i1.39120">https://doi.org/10.19184/jaei.v10i1.39120</a>.